-------------------------------------------------------------------------
Please, feel free to forward this message to interested people.
We apologize if you receive this email more than once.
-------------------------------------------------------------------------
Call for participation for the
19th IEEE/IFIP International Symposium on
Rapid System Prototyping
Monterey, CA, USA, 2-5 June 2008
http://www.rsp-symposium.org
= Important Dates =
* Early Registration Deadline: May, 5 2008
The IEEE/IFIP International Symposium on Rapid System Prototyping
(RSP) explores trends in Rapid Product Development of Computer Based
Systems. Its scope ranges from formal methods for the verification of
software and hardware systems to case studies of actual software and
hardware systems. It aims to bring together researchers from the
hardware and software communities to share their experiences and to
foster collaboration of new and innovative Science and Technology. The
19th annual symposium's focus will encompass theoretical and practical
methodologies, resolving technologies of specification, completeness,
dynamics of change, technology insertion, complexity, integration, and
time to market.
The event also features two tutorials, "Light-Weight UML-based Formal
Validation and Verification Methodology and Tool" by Doron Drusinsky
and "Network-on-Chip (NoC) theory and practice" by Dr. Fabien
Clermidy, and three keynote lectures, "The RTSJ for Prototyping Real-
Time Systems: A Case Study" by Dr. Greg Bollella, Distinguished
Engineer and Director of Strategy for Real-Time Java at Sun
Microsystems, "Multi-Dimensional Model Based Engineering for
Performance Critical Computer Systems Using AADL" by Bruce Lewis, a
senior experimental developer for the US Army's Aviation and Missile
Command, Research, Development and Engineering Laboratory, Software
Engineering Directorate, and "Testing automotive system prototypes far
before driving on the proving ground" by Dr. Eric Sax, the leader of
the EE Test-Engineering division of the MBtech Group.
SPONSORS: IEEE Reliability Society, International Federation for
Information Processing
